Quantum-mechanical displacement sensing using InAs/AlGaSb micromechanical cantilevers

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 21, Issue 2-4, 2004, Pages 1053-1056

  Yamaguchi, H ^a   Miyashita, S ^b   Hirayama, Y ^a,c  

^a Kashino Diverse Brain Research Laboratory of NTT Communication Science Laboratories   (Japan)

^b NTT Advanced Technology Corporation   (Japan)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

2DEG; InAs; MEMS; NEMS; UCF

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTANCE; ELECTRON GAS; MICROELECTROMECHANICAL DEVICES; QUANTUM THEORY; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING INDIUM COMPOUNDS;

INAS; NANOELECTROMECHANICAL SYSTEMS (NEMS); TWO DIMENSIONAL ELECTRON GAS (2DEG); UNIVERSAL CONDUCTANCE FLUCTUATION (UCF);

HETEROJUNCTIONS;

EID: 1642367745     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physe.2003.11.183     Document Type: Conference Paper

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