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Volumn 226, Issue 1-3 SPEC. ISS., 2004, Pages 231-236
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Optical thin film formation by oxygen cluster ion beam assisted depositions
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Author keywords
Cluster ion beam; Ion assist deposition; Surface smoothing
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
EXPLOSIVES;
HELIUM;
ION BEAM ASSISTED DEPOSITION;
OXYGEN;
POROSITY;
QUARTZ;
SCANNING ELECTRON MICROSCOPY;
SILICA;
SURFACE ROUGHNESS;
X RAY DIFFRACTION;
CLUSTER ION BEAM;
ION ASSIST DEPOSITION;
SURFACE SMOOTHING;
OPTICAL FILMS;
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EID: 1642350870
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2003.11.025 Document Type: Conference Paper |
Times cited : (17)
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References (6)
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