Fault Diagnosis for RAMs Using Walsh Spectrum

IEICE Transactions on Information and Systems

Volumn E87-D, Issue 3, 2004, Pages 592-600

  Iseno, Atsumu ^a   Iguchi, Yukihiro ^a   Sasao, Tsutomu ^b  

^a MEIJI UNIVERSITY   (Japan)

^b KYUSHU INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

BIST; Diagnosis; Fail bitmap; Memory test; Walsh spectrum

Indexed keywords

BUILT-IN SELF TEST; DECODING; HIERARCHICAL SYSTEMS; MATHEMATICAL MODELS; SECURITY SYSTEMS; WALSH TRANSFORMS;

FAIL-BITMAP; MEMORY TESTS; TEST DIAGNOSIS; WALSH SPECTRUM;

RANDOM ACCESS STORAGE;

EID: 1642307561     PISSN: 09168532     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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