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Volumn 5537, Issue , 2004, Pages 154-160

Small d-spacing WSi 2/Si narrow bandpass multilayers

Author keywords

Multilayer mirrors; Sputter deposition; X ray optics

Indexed keywords

CONSTANT CURRENTS; MULTILAYER MIRRORS; SPECTRAL RESOLUTIONS; X-RAY OPTICS;

EID: 15844419365     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.561399     Document Type: Conference Paper
Times cited : (20)

References (16)
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    • (2000) Advances in X-ray Analysis , vol.42 , pp. 308-320
    • Michaelsen, C.1    Ricardo, P.2    Anders, D.3    Schuster, M.4    Schilling, J.5    Göbel, H.6
  • 4
    • 0033336868 scopus 로고    scopus 로고
    • In situ spectroscopic ellipsometry as a surface-sensitive tool to probe thin film growth
    • C. Liu, J. Erdmann, A. Macrander, "In situ spectroscopic ellipsometry as a surface-sensitive tool to probe thin film growth," Thin Solid Films 355-356, 41-48 (1999).
    • (1999) Thin Solid Films , vol.355-356 , pp. 41-48
    • Liu, C.1    Erdmann, J.2    Macrander, A.3
  • 5
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    • 84860099826 scopus 로고    scopus 로고
    • D. L. Windt, http://cletus.phys.columbia.edu/~windt/idl/.
    • Windt, D.L.1
  • 10
    • 0029236404 scopus 로고
    • 2-Si x-ray multilayer mirrors on Russian orbital station 'Mir'
    • 2-Si x-ray multilayer mirrors on Russian orbital station 'Mir'," SPIE 2453, 11-14 (1995).
    • (1995) SPIE , vol.2453 , pp. 11-14
    • Fedorenko, A.I.1
  • 11
    • 0029233987 scopus 로고
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    • 2-Si x-ray multilayer mirrors," SPIE 2453, 15-24 (1995).
    • (1995) SPIE , vol.2453 , pp. 15-24
    • Fedorenko, A.I.1
  • 12
    • 0001368790 scopus 로고    scopus 로고
    • Growth, structure, and performance of depth-graded W/Si multilayers
    • D. L. Windt et al., "Growth, structure, and performance of depth-graded W/Si multilayers," J. Appl. Phys. 88, 460-470 (2000).
    • (2000) J. Appl. Phys. , vol.88 , pp. 460-470
    • Windt, D.L.1
  • 13
    • 0004055759 scopus 로고
    • SPIE Optical Engineering Press, Bellingham, WA
    • E. Spiller, Soft X-ray Optics, SPIE Optical Engineering Press, Bellingham, WA, 1994.
    • (1994) Soft X-ray Optics
    • Spiller, E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.