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Volumn 88, Issue 1, 2000, Pages 460-470

Growth, structure, and performance of depth-graded W/Si multilayers for hard x-ray optics

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001368790     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.373681     Document Type: Article
Times cited : (94)

References (54)
  • 10
    • 85037498286 scopus 로고    scopus 로고
    • note
    • As Shih and Stobbs point out, however, due to the finite sample thickness it is not possible from electron microscopy to accurately distinguish between rough and diffuse interfaces.
  • 22
    • 84889131052 scopus 로고    scopus 로고
    • General Optics Inc., 5390 Kazuko Court, Moorpark, CA 93021
    • General Optics Inc., 5390 Kazuko Court, Moorpark, CA 93021.
  • 23
    • 0001634592 scopus 로고    scopus 로고
    • D. L. Windt, Comput. Phys. 12, 360 (1998); the calculations included here were made using IMD Ver. 4.1, available from http://cletus.phys.columbia.edu/~windt/imd.
    • (1998) Comput. Phys. , vol.12 , pp. 360
    • Windt, D.L.1
  • 24
    • 85037500432 scopus 로고    scopus 로고
    • D. L. Windt, Comput. Phys. 12, 360 (1998); the calculations included here were made using IMD Ver. 4.1, available from http://cletus.phys.columbia.edu/~windt/imd.
    • IMD Ver. 4.1
  • 35
    • 85037508647 scopus 로고    scopus 로고
    • 3. These atomic scattering factors do not include corrections due to Compton scattering in the layers, and so the reflectance calculations made at the highest energies (E> ∼60 keV) might be slightly higher than they would otherwise be if Compton-scattering-corrected atomic scattering factors were available.
  • 36
    • 85037501158 scopus 로고    scopus 로고
    • note
    • We note again, however, that quantitative interface parameters cannot be drawn with high precision from these measurements: even though the signal-to-noise ratio is reasonably high for the data shown in Figs. 9(c) and 9(d), the reflectance is largely insensitive to small changes in σ at these small incidence angles, and the data are in fact consistent with interface widths in the range 0.2<σ<0.5 nm.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.