Lowpower weighted random pattern testing

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 19, Issue 11, 2000, Pages 13891398-

  Zhang, Xiaodong ^a   Shan, Wenlei ^a   Roy, Kaushik ^a  

^a SYNOPSYS INC   (United States)

Author keywords

Energy conscious testing; Low power; Lowpower bist; Lowpower testing; Random testing; Testing; Weighted random pattern testing

Indexed keywords

EID: 15844407390     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (34)

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