Advanced automatic test pattern generation and redundancy identification techniques.

Digest of Papers - FTCS (Fault-Tolerant Computing Symposium)

Volumn , Issue , 1988, Pages 30-35

  Schulz, Michael H ^a   Auth, Elisabeth ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TEST PATTERN GENERATION; IMPLICATION PROCEDURE; REDUNDANCY IDENTIFICATION; SENSITIZATION PROCEDURE; SOCRATES;

LOGIC CIRCUITS, COMBINATORIAL;

EID: 0024137442     PISSN: 07313071     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)