Functional fault coverage: The chamber of secrets or an accurate estimation of gate-level coverage?

Proceedings - Ninth IEEE European Test Symposium, ETS 2004

Volumn , Issue , 2004, Pages 154-159

  Fummi, Franco ^a   Marconcini, Cristina ^a   Pravadelli, Graziano ^a  

^a UNIVERSITY OF VERONA   (Italy)

Author keywords

ATPG; Fault coverage; Fault model; Functional verification

Indexed keywords

AUTOMATIC TEST PATTERN GENERATOR (ATPG); FAULT COVERAGE; FAULT MODEL; FUNCTIONAL VERIFICATION;

ALGORITHMS; CORRELATION METHODS; GATES (TRANSISTOR); MATHEMATICAL MODELS; METRIC SYSTEM; NETWORKS (CIRCUITS); SIGNAL PROCESSING;

ELECTRIC FAULT CURRENTS;

EID: 15844397282     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ETSYM.2004.1347649     Document Type: Conference Paper

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