-
1
-
-
0028076309
-
Ultra high resolution x-ray tomography
-
Haddad, W.S., et al., Ultra high resolution x-ray tomography. Science, 1994. 266: p. 1213-1215.
-
(1994)
Science
, vol.266
, pp. 1213-1215
-
-
Haddad, W.S.1
-
2
-
-
0032211809
-
Cryo x-ray microscopy with high spatial resolution in amplitude and phase contrast
-
Schneider, G., Cryo x-ray microscopy with high spatial resolution in amplitude and phase contrast. Ultramicroscopy, 1998. 75: p. 85-104.
-
(1998)
Ultramicroscopy
, vol.75
, pp. 85-104
-
-
Schneider, G.1
-
3
-
-
0033973571
-
Soft x-ray microscopy with a cryo STXM: II. Tomography
-
Wang, Y., et al., Soft x-ray microscopy with a cryo STXM: II. Tomography. Journal of Microscopy, 2000. 197: p. 80-93.
-
(2000)
Journal of Microscopy
, vol.197
, pp. 80-93
-
-
Wang, Y.1
-
4
-
-
0001085542
-
Computed tomography of cryogenic biological specimens based on x-ray microscopic images
-
Weiβ, D., et al., Computed tomography of cryogenic biological specimens based on x-ray microscopic images. Ultramicroscopy, 2000. 84: p. 185-197.
-
(2000)
Ultramicroscopy
, vol.84
, pp. 185-197
-
-
Wei, D.1
-
5
-
-
1542373966
-
Developments in Limited Data Image Reconstruction Techniques for Ultrahigh-Resolution X-ray Tomographic Imaging of Microchips
-
San Diego, CA: SPIE
-
Haddad, W.S. and J.E. Trebes. Developments in Limited Data Image Reconstruction Techniques for Ultrahigh-Resolution X-ray Tomographic Imaging of Microchips, in Developments in X-ray Tomography. 1997. San Diego, CA: SPIE.
-
(1997)
Developments in X-ray Tomography
-
-
Haddad, W.S.1
Trebes, J.E.2
-
6
-
-
0001900677
-
Tomographic reconstruction of an integrated circuit interconnect
-
Levine, Z.H., et al., Tomographic reconstruction of an integrated circuit interconnect. Applied Physics Letters, 1999. 74(1): p. 150-152.
-
(1999)
Applied Physics Letters
, vol.74
, Issue.1
, pp. 150-152
-
-
Levine, Z.H.1
-
7
-
-
0000873238
-
Tomography of an integrated circuit interconnect with an electromigration void
-
Levine, Z.H., et al., Tomography of an integrated circuit interconnect with an electromigration void. Journal of Applied Physics, 2000. 87(9): p. 4483-4488.
-
(2000)
Journal of Applied Physics
, vol.87
, Issue.9
, pp. 4483-4488
-
-
Levine, Z.H.1
-
8
-
-
1542314027
-
Hard x-ray microscopy and tomography at the ALS: Experiments and plans
-
Berkeley, CA: American Institute of Physics
-
Yun, W., et al. Hard x-ray microscopy and tomography at the ALS: experiments and plans, in X-ray Microscopy: Proceedings of the Sixth International Conference. 2000. Berkeley, CA: American Institute of Physics.
-
(2000)
X-ray Microscopy: Proceedings of the Sixth International Conference
-
-
Yun, W.1
-
9
-
-
0035952777
-
In situ x-ray microscopic observation of the electromigration in passivated Cu interconnects
-
Schneider, G., et al., In situ x-ray microscopic observation of the electromigration in passivated Cu interconnects. Applied Physics Letters, 2001. 78(13): p. 1936-1938.
-
(2001)
Applied Physics Letters
, vol.78
, Issue.13
, pp. 1936-1938
-
-
Schneider, G.1
-
10
-
-
0008958419
-
Quantitative micro- And histo-chemical elementary analysis by Roentgen absorption spectrography
-
Engström, A., Quantitative micro- and histo-chemical elementary analysis by Roentgen absorption spectrography. Acta Radiologica (Supplementum LXIII), 1946. 63: p. 1-106.
-
(1946)
Acta Radiologica (Supplementum LXIII)
, vol.63
, pp. 1-106
-
-
Engström, A.1
-
11
-
-
0004932883
-
X-ray interactions: Photoabsorption, scattering, transmission, and reflection at E=5030,000 eV, Z=1-92
-
Henke, B.L., E.M. Gullikson, and J.C. Davis, X-ray interactions: photoabsorption, scattering, transmission, and reflection at E=5030,000 eV, Z=1-92. Atomic Data and Nuclear Data Tables, 1993. 54: p. 181-342.
-
(1993)
Atomic Data and Nuclear Data Tables
, vol.54
, pp. 181-342
-
-
Henke, B.L.1
Gullikson, E.M.2
Davis, J.C.3
-
12
-
-
0003645230
-
-
Academic Press, Inc., San Diego
-
Rosenfeld, A. and Kak, A. C., Digital Picture Processing, Academic Press, Inc., San Diego, 1982.
-
(1982)
Digital Picture Processing
-
-
Rosenfeld, A.1
Kak, A.C.2
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