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Volumn 275, Issue 1-2, 2005, Pages

Structure of non-stoichiometric Sr-Bi-Nb-O thin films grown by PLD

Author keywords

A1. Planar defects; A1. X ray diffraction; A3. Vapour phase epitaxy; B1. Bismuth compounds; B2. Ferroelectric materials

Indexed keywords

BISMUTH COMPOUNDS; COMPUTER SIMULATION; FATIGUE OF MATERIALS; FERROELECTRIC MATERIALS; OPTICAL DEVICES; PULSED LASER DEPOSITION; STACKING FAULTS; STOICHIOMETRY; THIN FILMS; VAPOR PHASE EPITAXY; X RAY DIFFRACTION ANALYSIS;

EID: 15844363070     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2004.11.383     Document Type: Conference Paper
Times cited : (3)

References (26)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.