Structural characterization of thin films of the SrBi2Nb2O9 ferroelectric aurivillius phase epitaxially grown on (110)SrTiO3

Journal of Applied Crystallography

Volumn 36, Issue 1, 2003, Pages 96-102

  Duclere J R ^a   Guilloux Viry, M ^a   Perrin, A ^a  

^a Laboratoire de Chimie du Solide et Inorganique Moleculaire de Rennes   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH; IRON; NIOBIUM; OXYGEN; STRONTIUM; TITANIUM;

ARTICLE; CRYSTAL; ELECTRICITY; ELECTRON; FILM; STRUCTURE ANALYSIS; X RAY DIFFRACTION;

EID: 0038374829     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889802020095     Document Type: Article

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