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Volumn 45, Issue 3-4, 2005, Pages 527-534

100 μm Pitch flip chip on foil assemblies with adhesive interconnections

Author keywords

[No Author keywords available]

Indexed keywords

ADHESIVES; DIFFUSION; ELECTRONICS PACKAGING; LIQUID CRYSTAL DISPLAYS; MOBILE TELECOMMUNICATION SYSTEMS; MOISTURE; SOLDERING;

EID: 15744380194     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2004.06.006     Document Type: Article
Times cited : (8)

References (15)
  • 1
    • 0002772923 scopus 로고    scopus 로고
    • Contact reliability modeling and material behavior of conductive adhesives under thermomechanical loads
    • J. Liu Electrochemical Publications
    • S.X. Wu, K.X. Hu, and C.P. Yeh Contact reliability modeling and material behavior of conductive adhesives under thermomechanical loads J. Liu Conductive adhesives for electronics packaging 1999 Electrochemical Publications [chapter 6]
    • (1999) Conductive Adhesives for Electronics Packaging
    • Wu, S.X.1    Hu, K.X.2    Yeh, C.P.3
  • 2
    • 2342512262 scopus 로고    scopus 로고
    • Contact resistance of anisotropic conductive adhesives
    • Divigalpitiya R, Hogerton P. Contact resistance of anisotropic conductive adhesives. In: Proc IMAPS2003, 2003. p. 471-6
    • (2003) Proc IMAPS2003 , pp. 471-476
    • Divigalpitiya, R.1    Hogerton, P.2
  • 3
    • 0142195944 scopus 로고    scopus 로고
    • Humidity and reflow resistance of flip chip on foil assemblies with conductive adhesive joints
    • J. de Vries, and E. Janssen Humidity and reflow resistance of flip chip on foil assemblies with conductive adhesive joints IEEE. Trans. Compon. Pack. Technol. 26 2003 563 568
    • (2003) IEEE. Trans. Compon. Pack. Technol. , vol.26 , pp. 563-568
    • De Vries, J.1    Janssen, E.2
  • 4
    • 15744394694 scopus 로고    scopus 로고
    • Preconditioning of plastic surface mount devices prior to reliability testing
    • JESD22-A113, March. IPC/JEDEC standard J-STD-020-B, July
    • Preconditioning of plastic surface mount devices prior to reliability testing. JESD22-A113, March 1999; Moisture/reflow sensitivity classification for non-hermetic solid state surface mount devices. IPC/JEDEC standard J-STD-020-B, July 2002
    • (1999) Moisture/Reflow Sensitivity Classification for Non-hermetic Solid State Surface Mount Devices
  • 5
    • 0030212322 scopus 로고    scopus 로고
    • Anisotropically conductive adhesive flip-chip bonding on rigid and flexible printed circuit substrates
    • Z. Lai, and J. Liu Anisotropically conductive adhesive flip-chip bonding on rigid and flexible printed circuit substrates IEEE Trans. Compon. Pack. Manufact. Technol. 19 1996 644 660
    • (1996) IEEE Trans. Compon. Pack. Manufact. Technol. , vol.19 , pp. 644-660
    • Lai, Z.1    Liu, J.2
  • 6
    • 0002725101 scopus 로고    scopus 로고
    • Recent advances in conductive adhesives for direct chip attach applications
    • J. Liu Recent advances in conductive adhesives for direct chip attach applications Microsyst. Technol. 5 1998 72 80
    • (1998) Microsyst. Technol. , vol.5 , pp. 72-80
    • Liu, J.1
  • 8
    • 0030288469 scopus 로고    scopus 로고
    • On the failure mechanism of anisotropically conductive adhesive joints on copper metallization
    • J. Liu On the failure mechanism of anisotropically conductive adhesive joints on copper metallization Int. J. Adhesion Adhesives 16 1996 285 287
    • (1996) Int. J. Adhesion Adhesives , vol.16 , pp. 285-287
    • Liu, J.1
  • 13
    • 2442442805 scopus 로고    scopus 로고
    • Failure mechanism of anisotropic conductive adhesive interconnections in flip chip ICs on flexible substrates
    • J. de Vries Failure mechanism of anisotropic conductive adhesive interconnections in flip chip ICs on flexible substrates IEEE Trans. Compon. Pack Technol. 27 2004 161 166
    • (2004) IEEE Trans. Compon. Pack Technol. , vol.27 , pp. 161-166
    • De Vries, J.1
  • 15
    • 15744381101 scopus 로고    scopus 로고
    • SMT-Compatibility of adhesive flip chip on foil interconnections with 40 μm pitch
    • submitted for publication
    • de Vries J, van Delft J, Slob C. SMT-Compatibility of adhesive flip chip on foil interconnections with 40 μm pitch. IEEE Trans Comp Pack Techn, submitted for publication
    • IEEE Trans Comp Pack Techn
    • De Vries, J.1    Van Delft, J.2    Slob, C.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.