Quantitative nanotribology by atomic force microscopy

Journal of Physics D: Applied Physics

Volumn 38, Issue 6, 2005, Pages 895-899

  Morel, N ^a   Tordjeman, Ph ^a   Ramonda, M ^b  

^a UNIVERSITÉ MONTPELLIER II   (France)

^b UNIV MONTPELLIER   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CANTILEVER BEAMS; ELASTIC MODULI; FRICTION; LUBRICATION; MATHEMATICAL MODELS; SILICON WAFERS; STIFFNESS;

MECHANICAL RESPONSE; NANOFRICTION COEFFICIENT; NANOTRIBOLOGY; SILICATE GLASS;

TRIBOLOGY;

EID: 15744370270     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/38/6/018     Document Type: Article

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