The electro-thermal smoothie database model for LDMOS devices

ESSCIRC 2004 - Proceedings of the 34th European Solid-State Device Research Conference

Volumn , Issue , 2004, Pages 457-460

  Cuoco, V ^a   Neo, W C E ^a   Spirito, M ^a   Yanson, O ^b   Nenadovic, N ^a   De Vreede, L C N ^a   Jos, H F F ^b   Burghartz, J N ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b NXP SEMICONDUCTORS   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DATABASE SYSTEMS; ELECTRIC CURRENTS; HEAT RESISTANCE; ISOTHERMS; MATHEMATICAL MODELS; PARAMETER ESTIMATION;

DATABASE MODEL; ELECTRO-THERMAL (EC) EXTENSION; ISOTHERMAL MEASUREMENTS; THERMAL MEMORY EFFECTS;

MOS DEVICES;

EID: 15744363579     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)

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