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Volumn , Issue , 2001, Pages

Isothermal Non-Linear Device Characterization

Author keywords

model verification; pulsed distortion measurements; Self heating effects; third order intercept point

Indexed keywords

HIGH ELECTRON MOBILITY TRANSISTORS; ISOTHERMS; SEMICONDUCTOR DEVICES; WIRELESS TELECOMMUNICATION SYSTEMS;

EID: 84949637565     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.2001.327493     Document Type: Conference Paper
Times cited : (6)

References (7)
  • 1
    • 0002322765 scopus 로고
    • Technology-independent largesignal FET models: A measurement-based approach to active device modeling
    • Sept.
    • D.E. Root, S. Fan, and J. Meyer, "Technology-independent largesignal FET models: A measurement-based approach to active device modeling", Proc. 15th ARMMS Conf., Bath, U.K., Sept. 1991, pp. 1-21.
    • (1991) Proc. 15th ARMMS Conf., Bath, U.K. , pp. 1-21
    • Root, D.E.1    Fan, S.2    Meyer, J.3
  • 2
    • 84906682006 scopus 로고    scopus 로고
    • The smoothie" data base model for fet devices
    • Dec. 2001
    • V. Cuoco and L.C.N. de Vreede, "The "Smoothie" Data Base Model for FET Devices", Proocedings of SAFE 2001, Dec. 2001.
    • (2001) Proocedings of SAFE
    • Cuoco, V.1    De Vreede, L.C.N.2
  • 3
    • 0000981238 scopus 로고    scopus 로고
    • Bipolar transistor epilayer design using the maids mixed level simulator
    • September
    • L.C.N. de Vreede et al. "Bipolar Transistor Epilayer Design Using the MAIDS Mixed Level Simulator", IEEE Journal of Solid-State Circuits, vol. 34, no. 0, September 1999.
    • (1999) IEEE Journal of Solid-State Circuits , vol.34
    • De Vreede, L.C.N.1
  • 6
    • 0035446307 scopus 로고    scopus 로고
    • Improved compact modeling of output conductance and cutoff frequency of bipolar transistors
    • Sep.
    • J.C.J. Paasschens, W.J. Kloosterman, R.J. Havens, H.C. de Graaff, "Improved compact modeling of output conductance and cutoff frequency of bipolar transistors," IEEE Journal of Solid-State Circuits, vol.: 36, no: 9, Sep. 2001, pp.1390-1398.
    • (2001) IEEE Journal of Solid-State Circuits , vol.36 , Issue.9 , pp. 1390-1398
    • Paasschens, J.C.J.1    Kloosterman, W.J.2    Havens, R.J.3    De Graaff, H.C.4
  • 7
    • 0012104956 scopus 로고    scopus 로고
    • Motorola's electro thermal (MET)
    • online
    • Motorola's Electro Thermal (MET) LDMOS Model, online: www.mot-sps.com/models/ldmos/ldmosmodels.html.
    • LDMOS Model


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.