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Volumn , Issue , 2001, Pages
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Isothermal Non-Linear Device Characterization
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Author keywords
model verification; pulsed distortion measurements; Self heating effects; third order intercept point
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Indexed keywords
HIGH ELECTRON MOBILITY TRANSISTORS;
ISOTHERMS;
SEMICONDUCTOR DEVICES;
WIRELESS TELECOMMUNICATION SYSTEMS;
CHARACTERIZATION METHODS;
DATA REPRESENTATIONS;
DISTORTION MEASUREMENT;
ISOTHERMAL MEASUREMENTS;
MODEL VERIFICATION;
SELF-HEATING EFFECT;
SEMICONDUCTOR DEVICE CHARACTERIZATION;
THIRD ORDER INTERCEPT POINTS;
CHARACTERIZATION;
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EID: 84949637565
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ARFTG.2001.327493 Document Type: Conference Paper |
Times cited : (6)
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References (7)
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