Microwave loss mechanisms in Ba0.25Sr0.75TiO 3 films

Materials Science and Engineering: B

Volumn 118, Issue 1-3, 2005, Pages 214-218

  Vorobiev, A ^a   Rundqvist, P ^a   Gevorgian, S ^a,b  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^b Ericsson Microwave Systems AB   (Sweden)

Author keywords

Dielectric loss; Ferroelectric; Microwave

Indexed keywords

ANNEALING; BARIUM COMPOUNDS; DIELECTRIC LOSSES; FERROELECTRIC MATERIALS; GOLD; GRAIN BOUNDARIES; MICROWAVES; TITANIUM COMPOUNDS; VARACTORS;

FERROELECTRIC FILMS; METAL LOSSES; OXYGEN VACANCIES; THIN FILM VARACTORS;

THIN FILMS;

EID: 15444367912     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2004.12.032     Document Type: Conference Paper

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