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Volumn 1, Issue 1, 2002, Pages 602-606

Thermally Activated Ageing of Polysilicon

Author keywords

Ageing; Micro hotplate; Polysilicon

Indexed keywords

CHEMICAL SENSORS; COOLING; DIELECTRIC MATERIALS; ELECTROMIGRATION; HEAT RESISTANCE; HEATING; HIGH TEMPERATURE EFFECTS; MICROSTRUCTURE; RESISTORS; SILICON NITRIDE; THERMAL CYCLING; THERMISTORS;

EID: 1542361439     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (7)

References (9)
  • 5
    • 50149095145 scopus 로고
    • Electrical and Optical Characteristics of Vacuum-Sealed Polysilicon Micro-lamps
    • Mastrangelo, C.H., Hsi-Jen Yeh, J., Muller, R.S., "Electrical and Optical Characteristics of Vacuum-Sealed Polysilicon Micro-lamps", IEEE Trans. Electron Dev., Vol. 39, No. 6 (1992), pp. 1363-1375
    • (1992) IEEE Trans. Electron Dev. , vol.39 , Issue.6 , pp. 1363-1375
    • Mastrangelo, C.H.1    Hsi-Jen Yeh, J.2    Muller, R.S.3
  • 7
    • 0032633829 scopus 로고    scopus 로고
    • Design and fabrication of low power polysilicon sources
    • Das, N.C., Monroy, C., Robinson, D., Jhabvala M., "Design and fabrication of low power polysilicon sources", Solid-State Elec., Vol. 43, (1999), pp. 1239-1244
    • (1999) Solid-state Elec. , vol.43 , pp. 1239-1244
    • Das, N.C.1    Monroy, C.2    Robinson, D.3    Jhabvala, M.4
  • 8
    • 0035020746 scopus 로고    scopus 로고
    • Ageing behavior of polysilicon heaters for CMOS microstructures operated at temperatures up to 1200 K
    • Ehmann, M., Ruther, P., von Arx, M., Baltes, H., Paul, O., "Ageing behavior of polysilicon heaters for CMOS microstructures operated at temperatures up to 1200 K", Proc. MEMS 2001, (2001), pp. 147-150
    • (2001) Proc. MEMS 2001 , pp. 147-150
    • Ehmann, M.1    Ruther, P.2    Von Arx, M.3    Baltes, H.4    Paul, O.5
  • 9
    • 0018997923 scopus 로고
    • Structure and properties of LPCVD silicon films
    • Kamins, T.I., "Structure and properties of LPCVD silicon films", Solid-State Science and Technology, Vol. 127, No. 3, (1980), pp. 686-690
    • (1980) Solid-state Science and Technology , vol.127 , Issue.3 , pp. 686-690
    • Kamins, T.I.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.