An Observer Based Sample Detection Scheme for Atomic Force Microscopy

Proceedings of the IEEE Conference on Decision and Control

Volumn 3, Issue , 2003, Pages 2132-2137

  Sebastian, Abu ^a   Sahoo, Deepak R ^a   Salapaka, Murti V ^a  

^a Iowa State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; BANDWIDTH; COMPUTER SIMULATION; DATA REDUCTION; IMAGING TECHNIQUES; KALMAN FILTERING; NATURAL FREQUENCIES; OPTICAL RESOLVING POWER; OSCILLATIONS; THERMAL NOISE;

MICRO-CANTILEVERS; REPULSIVE FORCES;

ATOMIC FORCE MICROSCOPY;

EID: 1542349121     PISSN: 07431546     EISSN: 25762370     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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