Quantifying recrystallization by electron backscatter diffraction

Journal of Microscopy

Volumn 213, Issue 3, 2004, Pages 241-246

  Jazaeri, H ^a   Humphreys, F J ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

EBSD; Line scanning; Mapping; Quantitative metallography; Recrystallization

Indexed keywords

ANNEALING; BACKSCATTERING; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; VOLUME FRACTION;

EBSD; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION; HIGH ANGLE GRAIN BOUNDARIES; HIGH RESOLUTION ELECTRON BACKSCATTER DIFFRACTIONS; LINESCANNING; QUANTITATIVE METALLOGRAPHY; RECRYSTALLISATION; SCANNING ELECTRONS; VOLUME FRACTION OF RECRYSTALLIZATION;

RECRYSTALLIZATION (METALLURGY);

ANALYTIC METHOD; CHEMICAL REACTION KINETICS; CONFERENCE PAPER; CRYSTALLIZATION; DIFFRACTION; ELECTRON; ELECTRON BACKSCATTER DIFFRACTION; HARDNESS; MATERIALS; OPTICAL RESOLUTION; PHASE TRANSITION; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS; QUANTITATIVE METALLOGRAPHY; RELIABILITY; SCANNING ELECTRON MICROSCOPE; SCANNING ELECTRON MICROSCOPY;

EID: 1542289111     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.0022-2720.2004.01296.x     Document Type: Conference Paper

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