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Volumn 116, Issue 3, 2005, Pages 111-117

Improvement of confocal microscope performance by shaped annular beam and heterodyne confocal techniques

Author keywords

Annular pupil filter technique; Binary optical shaping; Confocal microscope; Measurement range; Superresolution measurement

Indexed keywords

BESSEL FUNCTIONS; DETECTORS; FOURIER TRANSFORMS; IMAGING TECHNIQUES; LENSES; LIGHT SOURCES; MICROSCOPIC EXAMINATION; MICROSTRUCTURE; OPTICAL RESOLVING POWER; OPTICAL SYSTEMS; REFLECTION; SURFACE ROUGHNESS;

EID: 15344345712     PISSN: 00304026     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijleo.2004.12.007     Document Type: Article
Times cited : (8)

References (9)
  • 1
    • 0031079146 scopus 로고    scopus 로고
    • Noninterferometric differential confocal microscopy with 2-nm depth resolution
    • C.H. Lee, and J.P. Wang Noninterferometric differential confocal microscopy with 2-nm depth resolution Opt. Commun. 35 1997 233 237
    • (1997) Opt. Commun. , vol.35 , pp. 233-237
    • Lee, C.H.1    Wang, J.P.2
  • 2
    • 0141963349 scopus 로고    scopus 로고
    • Sub-diffraction-limit imaging based on the topographic contrast of differential confocal microscopy
    • C.H. Lee, H.-Y. Chiang, and H.-Y. Mong Sub-diffraction-limit imaging based on the topographic contrast of differential confocal microscopy Opt. Lett. 28 2003 698 700
    • (2003) Opt. Lett. , vol.28 , pp. 698-700
    • Lee, C.H.1    Chiang, H.-Y.2    Mong, H.-Y.3
  • 3
    • 0033726098 scopus 로고    scopus 로고
    • Characterization of surface topography by confocal microscopy, I. Principles and the measurement system
    • G. Udupa, M. Singaperuma, R.S. Sirohi, and M.P. Kothiyal Characterization of surface topography by confocal microscopy, I. Principles and the measurement system Meas. Sci. Technol. 11 2000 305 314
    • (2000) Meas. Sci. Technol. , vol.11 , pp. 305-314
    • Udupa, G.1    Singaperuma, M.2    Sirohi, R.S.3    Kothiyal, M.P.4
  • 4
    • 0033691056 scopus 로고    scopus 로고
    • Characterization of surface topography by confocal microscopy, II. The micro and macro surface irregularities
    • G. Udupa, M. Singaperumal, R.S. Sirohi, and M.P. Kothiyal Characterization of surface topography by confocal microscopy, II. The micro and macro surface irregularities Meas.Sci.Technol. 11 2000 315 329
    • (2000) Meas.Sci.Technol. , vol.11 , pp. 315-329
    • Udupa, G.1    Singaperumal, M.2    Sirohi, R.S.3    Kothiyal, M.P.4
  • 5
    • 0343290253 scopus 로고    scopus 로고
    • Surface profilometry with a fibre optical confocal scanning microscope
    • Yang Lisong, Wang Guiying, Wang Jiangang, and Xu Zhizhan Surface profilometry with a fibre optical confocal scanning microscope Meas. Sci. Technol. 11 2000 1786 1791
    • (2000) Meas. Sci. Technol. , vol.11 , pp. 1786-1791
    • Yang, L.1    Wang, G.2    Wang, J.3    Xu, Z.4
  • 6
    • 1942422700 scopus 로고    scopus 로고
    • Micromachined transmissive scanning confocal microscope
    • Sunghoon Kwon, and L.P. Lee Micromachined transmissive scanning confocal microscope Opt.Lett. 29 2004 706 708
    • (2004) Opt.Lett. , vol.29 , pp. 706-708
    • Sunghoon, K.1    Lee, L.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.