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Volumn 290-291 PART 2, Issue , 2005, Pages 1395-1397
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Characterization of Al(Cr)N and Ga(Cr)N dilute magnetic semiconductors
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Author keywords
Dilute magnetic semiconductor; Ferromagnetism; MBE; Microstructure
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Indexed keywords
ANTIFERROMAGNETISM;
CHROMIUM;
CRYSTALLINE MATERIALS;
ELECTRON DIFFRACTION;
ELECTRON MICROSCOPY;
FERROMAGNETISM;
MAGNETIC THIN FILMS;
MICROSTRUCTURE;
MOLECULAR BEAM EPITAXY;
SEMICONDUCTING ALUMINUM COMPOUNDS;
SEMICONDUCTING GALLIUM COMPOUNDS;
STRUCTURE (COMPOSITION);
X RAY DIFFRACTION ANALYSIS;
DILUTE MAGNETIC SEMICONDUCTORS (DMS);
ENERGY-FILTERD IMAGING;
IMPURITY CLUSTERS;
ROOM TEMPERATURE FERROMAGNETISM;
MAGNETIC SEMICONDUCTORS;
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EID: 14944341707
PISSN: 03048853
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jmmm.2004.11.446 Document Type: Article |
Times cited : (83)
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References (15)
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