Magnetic microscopy for ICs failure analysis : Comparative case studies using SQUID, GMR and MTJ systems

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

Volumn , Issue , 2004, Pages 45-48

  Crépel, Olivier ^a   Poirier, Patrick ^a   Descamps, Philippe ^a   Desplats, Romain ^b   Perdu, Philippe ^b   Haller, Gérald ^c   Firiti, Abdelhatif ^c  

^a NXP SEMICONDUCTORS   (Netherlands)

^b CNES   (France)

^c STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

MAGNETIC TUNNEL JUNCTIONS (MTJ); SENSITIVE SENSORS; SPATIAL RESOLUTION; THERMAL LASER STIMULATION TECHNIQUES;

AMPLIFIERS (ELECTRONIC); ELECTRIC RESISTANCE; FAILURE ANALYSIS; GIANT MAGNETORESISTANCE; LEAKAGE CURRENTS; MAGNETIC FIELD EFFECTS; MAGNETIC FLUX; MICROMACHINING; SENSITIVITY ANALYSIS; SENSORS; SIGNAL TO NOISE RATIO; SQUIDS; TUNNEL JUNCTIONS;

INTEGRATED CIRCUITS;

EID: 14844295007     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. "Advances in scanning SQUID microscopy for die-level and package-level fault isolation", L.A. Knauss, A. Orozco, S. Woods, A. Moghe, S.P. Singh, M.K. Shridharan, and Fred Cawthorne, ESREF 2003, Arcachon, France.
2. "Superconducting Quantum Interference Device Technique: 3-D Localization of a Short with in a Flip Chip Assembly", K.S. Wills, O.D. de Leon, K. Ramanujachar, and C. Todd, ISTFA 2001, Santa Clara, USA
3. "Giant Magnetoresistive in Soft Ferromagnetic Multilayers", Physical Review B43, pp. 1297-1300, 1991.
4. "Scanning magnetoresistive microscopy for die-level submicron current density mapping", B. D. Schrag, X. Y. Liu, M. J. Carter, and Gang Xiao, ISTFA 2003, Santa Clara, USA
5. "Microstructures of magnetic tunneling junctions", L. F. Li, X. Y. Liu, and Gang Xiao, Journal of Applied Physics 93, 467, 2003.
6. "Submicron electrical current density imaging of embedded microstrucrures", B. D. Schrag and Gang Xiao, Applied Physics Letters 82, 3272, 2003.
7. « Implementing Thermal Laser Stimulation in a Failure Analysis Laboratory », Beaudoin F., Perdu P., Desplats R. International Symposium on Test and Failure Analysis, ISTFA 2001, San Francisco, 11-16 novembre 2001