|
Volumn 2003-November, Issue , 2003, Pages 2-5
|
Scanning magnetoresistive microscopy for die-level sub-micron current density mapping
a a a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
DENSITY MAPPING;
FAULT ISOLATION;
IN-PLANE CURRENT DENSITY;
MAGNETORESISTIVE IMAGING;
RESOLVING FEATURES;
SCANNING MAGNETORESISTIVE MICROSCOPIES;
SPATIAL RESOLUTION;
STRAY MAGNETIC FIELDS;
SUBMICRON;
FAILURE ANALYSIS;
|
EID: 85124089982
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.31399/asm.cp.istfa2003p0002 Document Type: Conference Paper |
Times cited : (10)
|
References (5)
|