Implementing Thermal Laser Stimulation in a Failure Analysis Laboratory

Conference Proceedings from the International Symposium for Testing and Failure Analysis

Volumn , Issue , 2001, Pages 151-159

  Beaudoin, F ^a   Desplats, R ^a   Perdu, P ^a   Lewis, D ^b  

^a CNES   (France)

^b UNIVERSITÉ DE BORDEAUX   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); CMOS INTEGRATED CIRCUITS; ELECTRIC INVERTERS; ELECTRIC POTENTIAL; EMISSION SPECTROSCOPY; FAILURE ANALYSIS; FINITE ELEMENT METHOD; LIQUID CRYSTALS; OPTICAL MICROSCOPY;

LASER-SCANNING MICROSCOPES; THERMAL LASER STIMULATIONS;

INTEGRATED CIRCUITS;

EID: 1542270712     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. Wu N.M., Weaver K. and Lin J.H. ISTFA (1996) 393-399.
2. Barton D.L., Bernhard-Höfer K. and Cole Jr. E.I. Microelec. Reliab. (1999) 721-730.
3. Nikawa K. and Tozaki S. ISTFA (1993) 303-310
4. Cole Jr. E.I., Tangyunyong P. and Barton D.L. IRPS (1998) 129-136.
5. King R., Schaick C.V. and Lusk J. IRPS (1989) 141-151.
6. Shiles E., Sasaki T., Inokuti M. and Smith D.Y. Physical Review B 22 (1980) 1612-1628.
7. Paul O., von Arw M. and Baltes H. Transducers '95 - Eurosensors IX (1995) 178-181.