Spectral imaging in infrared microscope

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

Volumn , Issue , 2004, Pages 41-44

  Bailon, Michelle F ^a   Soriano, Maricor ^b   Tarun, Alvarado B ^a   Saloma, Caesar ^b  

^a Intel Technology Philippines Inc   (Philippines)

^b University of the Philippines ^*  (Philippines)

Author keywords

[No Author keywords available]

Indexed keywords

INFRARED EMISSION MICROSCOPE (IREM); LONGPASS IR FILTERS; SINGULAR VALUE DECOMPOSITION; SPECTRAL BAND FILTERS;

CHARGE COUPLED DEVICES; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRIC FILTERS; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; IMAGE RECONSTRUCTION; INFRARED DEVICES; INFRARED RADIATION; INTEGRAL EQUATIONS; MATRIX ALGEBRA; MICROSCOPES; PHOTONS;

IMAGING TECHNIQUES;

EID: 14844289527     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)

1. N. Khurana, Proc. of the Intl. Symp.for Test and FA (ISTFA 1989, Los Angels, USA), pp 277-283.
2. C.L. Chiang, Proc. of the VLSI Intl Educ. Workshop and Symp. (VLSI Technology, 1990)
3. C.F. Hawkins, J.M. Soden, E.I. Sole Jr.,and E.S. Snyder, Proc. of Intl Symp for Test and FA (ISTFA 1990, LA, USA), pp. 55-67.
4. T. Wallinger, Proc. of Intl Symp for Test and FA (ISTA 1991), pp 325-334.
5. K. de Kort and P. Damink, Proc. of the Workshop on Emission Microscopy, 1990, pp 45-52.
6. D.L. Barton, P. Tangyunyong, J. Soden, E. Cole Jr, and C. Henderson, Proc Int Symp Testing and Failure Anlysis (ISTFA '99), 14-18 Nov 99, SC, CA, USA, 1999, pp 57-67.
7. L. WB, Liu YY, Phang JCH, Chan DSH, Proc Int Symp Testing and Failure Analysis (ISTFA 03), 2-6 Nov 03, SC, CA, 2003, pp 311-316.
8. Tao JM, Chim WK, Chan DSH, Phang JCH, Liu YY, Proc 1966 Int Rel Phys Symp (IRPS '96), 29 Apr - 2 May 96, Dallas, Texas, USA, 1996, pp. 360-365.
9. Rasras M, De Wolf I, Groeseneken G, Macs HE, Vanhaeverbeke S, De Pauw P, Proc Int Symp Testing and Failure Analysis (ISTFA '97), USA, 1997, pp 153-157
10. www.irlabs.com
11. www.thorlabs.com
12. M. Soriano, W. Oblefias, C. Saloma, Optics Express, vol.10(25), 2002, pp. 1458-1464.
13. st Nationa Physics Congress Proceedings, USC, Cebu City, Oct 2003.
14. H. Ishizuka, M. Tanaka, H. Konishi, and H. Ishida, ISTFA 1990, pp13-19.