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Volumn 48, Issue 1, 2005, Pages 162-168

Teaching digital noise and noise margin issues in engineering education

Author keywords

Average noise threshold energy (ANTE); Noise immunity curve (NIC); Noise margin; Signal integrity

Indexed keywords

CURRICULA; ELECTRONICS ENGINEERING; SPURIOUS SIGNAL NOISE; TEACHING;

EID: 14644430967     PISSN: 00189359     EISSN: None     Source Type: Journal    
DOI: 10.1109/TE.2004.837042     Document Type: Article
Times cited : (23)

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    • J. Lohstroh, E. Seevinck, and J. DeGroot, "Worst-case static noise margin criteria for logic circuits and their mathematical equivalence," IEEE J. Solid-State Circuits, vol. SC-18, no. 6, pp. 803-806, Dec. 1983.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.