ESCA-thickness metrology and head-medium spacing impact of disk lubricant

IEEE Transactions on Magnetics

Volumn 41, Issue 2, 2005, Pages 621-625

  Tang, Huan ^a   Ma, Xiaoding ^a   Barth, Gunter ^a   Liu, Jianwei ^a   Stirniman, Michael ^a   Gui, Jing ^a  

^a SEAGATE TECHNOLOGY   (United States)

Author keywords

Attenuation length; ESCA; Head medium separation; Perfluoropolyethers (PFPE) lubricant

Indexed keywords

ATTENUATION; CHEMICAL ANALYSIS; ELECTRON SPECTROSCOPY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; PHOTOEMISSION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; POLYETHERS; THICK FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

ATTENUATION LENGTH; ELECTRON SPECTROSCOPY FOR CHEMICAL ANALYSIS (ESCA); HEAD-MEDIUM SEPARATION; LUBRICANT FILMS; PERFLUOROPOLYETHERS (PFPE) LUBRICANT; X-RAY REFLECTIVITY (XRR);

LUBRICANTS;

EID: 14544296104     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2004.838061     Document Type: Article

References (9)

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