XPS measurement of lubricant layer thickness on magnetic recording disks

Journal of Electron Spectroscopy and Related Phenomena

Volumn 81, Issue 1, 1996, Pages 79-85

  Hoshino, Mitsutoshi ^a   Kimachi, Yoshihiro ^a  

^a NTT CORPORATION   (Japan)

Author keywords

Lubricant; Magnetic disk; Measurement; Perfluoropolyether; Thickness; X ray photoelectron spectroscopy

Indexed keywords

EID: 0002142616     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/0368-2048(96)03036-8     Document Type: Article

References (11)

1. Y. Ando, R. Kaneko and S. Oguchi, Tribologist (in Japanese), 39 (2) (1994) 129, Tribologist (in Japanese), 1994, 39 2, 137.
2. Y. Ando, R. Kaneko and S. Oguchi, Tribologist (in Japanese), 39 (2) (1994) 129, Tribologist (in Japanese), 1994, 39 2, 137.
3. R.E. Linder and B. Mee, IEEE Trans. Magn., MAG-18 (6) (1982) 1073.
4. V. Au-Yeung, IEEE Trans. Magn., MAG-19 (5) (1983) 1662.
5. Y. Kimachi, F. Yoshimura, M. Hoshino and A. Terada, IEEE Trans. Magn., MAG-23 (5) (1987) 2392.
6. R. Flitsch and S.T. Raider, J. Vac. Sci. Technol., 12 (1) (1975) 305.
7. M.P. Seah and W.A. Dench, Surf. Interface Anal., 1 (1979) 2.
8. N. S. McIntype, Quantitative Surface Analysis of Materials, ASTM, 1977.
9. D.T. Clark, M.M. Abu-Shbak and W.J. Brennan, J. Electron Spectrosc. Relat. Phenom., 28 (1982) 11.
10. D.H. Clark and H.R. Thomas, J. Polym. Sci., Chem. Ed., 15 (1977) 2843.
11. S. Bagata, Symposium on Magnetic Media Manufacturing Method, Honolulu, May 1983.