Real-space electronic structure calculations of charged clusters and defects in semiconductors using a multigrid method

Physica B: Condensed Matter

Volumn 273-274, Issue , 1999, Pages 1003-1006

  Jin, Young Gu ^a   Jeong, J W ^a   Chang, K J ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; CHARGE CARRIERS; CRYSTAL DEFECTS; FINITE DIFFERENCE METHOD;

CHARGED CLUSTERS; MULTIGRID METHOD;

ELECTRONIC STRUCTURE;

EID: 0033340353     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)00619-5     Document Type: Article

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