TEM investigation of Si implanted natural diamond

Materials Science Forum

Volumn 353-356, Issue , 2001, Pages 199-202

  Pecz B ^a   Barna, A ^a   Heera, V ^a   Fontaine, F ^a   Skorupa, W ^a  

^a RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHIZATION; ION IMPLANTATION; SEMICONDUCTING DIAMONDS; SILICON; STRUCTURE (COMPOSITION); TRANSMISSION ELECTRON MICROSCOPY;

HIGHER DOSE IMPLANTATION; NATURAL DIAMOND; PHASE FORMATION;

SILICON CARBIDE;

EID: 14344271768     PISSN: 02555476     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (8)

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