|
Volumn 353-356, Issue , 2001, Pages 271-274
|
Ion bombardment induced damage in silicon carbide studied by ion beam analytical methods
a b b b b b a b |
Author keywords
[No Author keywords available]
|
Indexed keywords
BACKSCATTERING;
ELECTRON RESONANCE;
ION BOMBARDMENT;
ION IMPLANTATION;
RADIATION DAMAGE;
SPECTROMETRY;
TRANSMISSION ELECTRON MICROSCOPY;
CARBON SUBLATTICE;
CHANNELING;
SILICON CARBIDE;
|
EID: 14344268601
PISSN: 02555476
EISSN: None
Source Type: Conference Proceeding
DOI: 10.4028/www.scientific.net/msf.353-356.271 Document Type: Article |
Times cited : (3)
|
References (12)
|