메뉴 건너뛰기




Volumn 353-356, Issue , 2001, Pages 271-274

Ion bombardment induced damage in silicon carbide studied by ion beam analytical methods

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; ELECTRON RESONANCE; ION BOMBARDMENT; ION IMPLANTATION; RADIATION DAMAGE; SPECTROMETRY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 14344268601     PISSN: 02555476     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.4028/www.scientific.net/msf.353-356.271     Document Type: Article
Times cited : (3)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.