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Volumn 16, Issue 2, 2005, Pages 257-261

Redox-active monolayers on nano-scale silicon electrodes

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CHEMICAL VAPOR DEPOSITION; ELECTRIC CONDUCTANCE; ETCHING; MASKS; MONOLAYERS; SILICON;

EID: 14044272698     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/16/2/013     Document Type: Article
Times cited : (18)

References (11)
  • 1
    • 14044262085 scopus 로고    scopus 로고
    • The International Technology Roadmap 2002 (http://public.itrs.net/Files/ 2002Update/Home.pdf)
    • (2002)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.