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Volumn 83, Issue 1, 2003, Pages 198-200
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Electrical characterization of redox-active molecular monolayers on SiO2 for memory applications
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITORS;
CYCLIC VOLTAMMETRY;
DATA STORAGE EQUIPMENT;
ELECTRIC CONDUCTANCE;
MOLECULES;
OXIDATION;
REDUCTION;
SILICA;
MOLECULAR MONOLAYERS;
MONOLAYERS;
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EID: 0041705125
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1584088 Document Type: Article |
Times cited : (64)
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References (12)
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