메뉴 건너뛰기




Volumn 70, Issue 22, 2004, Pages

X-ray multiple diffraction from crystalline multilayers: Application to a 90° Bragg reflection

Author keywords

[No Author keywords available]

Indexed keywords

SILICON DERIVATIVE;

EID: 13844294344     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.70.224109     Document Type: Article
Times cited : (10)

References (38)
  • 26
    • 0004704903 scopus 로고
    • Akademische Verlagsgesellschaft, Frankfurt am Main
    • M. von Laue, Röntgenstrahl-Interferenzen (Akademische Verlagsgesellschaft, Frankfurt am Main, 1960).
    • (1960) Röntgenstrahl-Interferenzen
    • Von Laue, M.1
  • 38
    • 13844283257 scopus 로고    scopus 로고
    • S. A. Stepanov, http://sergey.gmca.aps.anl.gov/gid_sl.html
    • Stepanov, S.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.