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Physical Review B - Condensed Matter and Materials Physics

Volumn 63, Issue 9, 2001, Pages 941111-9411112

Multiple-beam x-ray diffraction near exact backscattering in silicon

(9) Sutter, John P a Alp, E Ercan a Hu, Michael Y a Lee, Peter L a Sinn, Harald a Sturhahn, Wolfgang a Toellner, Thomas S a Bortel, Gábor b Colella, Roberto c

a ARGONNE NATIONAL LABORATORY (United States)

b WIGNER RESEARCH CENTRE FOR PHYSICS (Hungary)

c PURDUE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

ACCURACY; ARTICLE; CRYSTAL; INTERFEROMETER; NEUTRON SCATTERING; PREDICTION; THEORY; X RAY DIFFRACTION;

EID: 0034910393 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.63.094111 Document Type: Article

Times cited : (39)

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