X-ray back-diffraction profiles with an Si (111) plate

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 52, Issue 4, 1996, Pages 614-620

  Cusatis, C ^a   Udron, D ^a   Mazzaro, I ^a   Giles, C ^b,c   Tolentino, H ^c  

^a FEDERAL UNIVERSITY OF PARANÁ   (Brazil)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c LABORATÓRIO NACIONAL DE LUZ SÍNCROTRON   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001470710     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108767396000761     Document Type: Article

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