X-ray interferometry with microelectronvolt resolution

Physical Review Letters

Volumn 90, Issue 1, 2003, Pages

  Shvyd'ko, Yu V ^a   Lerche, M ^a   Wille, H C ^a   Gerdau, E ^a   Lucht, M ^a   Ruter H D ^a   Alp, E E ^b   Khachatryan, R ^b  

^a UNIVERSITY OF HAMBURG   (Germany)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; COMPUTER SIMULATION; CRYSTALS; ELECTRON ENERGY LEVELS; INTERFEROMETRY; MIRRORS; PHOTONS; RESONANCE; SAPPHIRE; X RAYS;

BACK REFLECTING SAPPHIRE CRYSTAL MIRRORS; FABRY-PEROT TRANSMISSION RESONANCE; MICROELECTRONVOLT RESOLUTION; X RAY INTERFEROMETRY;

FABRY-PEROT INTERFEROMETERS;

EID: 0037428577     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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