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Measurement Science and Technology

Volumn 13, Issue 2, 2002, Pages 179-185

Optical material stress measurement using two orthogonally polarized sinusoidally intensity-modulated semiconductor lasers

(3) Mackey, Jeffrey R a Salari, Ezzatollah a Tin, Padetha b

a Toledo (United States)

b NASA GLENN RESEARCH CENTER (United States)

Author keywords

Birefringence; Laser; Optoelectronic; Polarization; Retardance; Stress

Indexed keywords

ANISOTROPY; LASER BEAMS; LIGHT POLARIZATION; MOLECULAR STRUCTURE; PHOTODETECTORS; SEMICONDUCTOR LASERS; STRAIN MEASUREMENT; STRESSES;

STRESS MEASUREMENT;

ELECTROOPTICAL DEVICES;

LASER; MEASUREMENT METHOD; OPTICAL TECHNIQUE; SEMICONDUCTOR; STRESS;

EID: 0036472841 PISSN: 09570233 EISSN: None Source Type: Journal
DOI: 10.1088/0957-0233/13/2/307 Document Type: Article

Times cited : (12)

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