Near-field scanning optical microscope based on fast birefringence measurement

Sensors and Materials

Volumn 13, Issue 8, 2001, Pages 433-443

  Ohkubo, Shinya ^a   Umeda, Norihiro ^a  

^a TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY   (Japan)

Author keywords

Birefringence; Fiber probe; Microscope scanning; Near field optics; Polarization

Indexed keywords

EID: 0035649040     PISSN: 09144935     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (11)

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