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Volumn 476, Issue 1, 2005, Pages 142-147

Diffusion barrier performances of thin Mo, Mo-N and Mo/Mo-N films between Cu and Si

Author keywords

Copper metallization; Diffusion barrier; Molybdenum; Sputtering

Indexed keywords

DIFFUSION IN SOLIDS; METALLIC FILMS; PARAMETER ESTIMATION; PROTECTIVE COATINGS; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; THERMAL EFFECTS; X RAY DIFFRACTION;

EID: 13844256787     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.09.046     Document Type: Article
Times cited : (63)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.