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Volumn 86, Issue 1, 2005, Pages

Self-assembly of Ni nanocrystals on HfO2 and N -assisted Ni confinement for nonvolatile memory application

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CMOS INTEGRATED CIRCUITS; HAFNIUM COMPOUNDS; LEAKAGE CURRENTS; NICKEL; NITRIDING; NONVOLATILE STORAGE; PERTURBATION TECHNIQUES; POLYSILICON; SCANNING ELECTRON MICROSCOPY;

EID: 13544264528     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1846952     Document Type: Article
Times cited : (80)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.