Surface and interface analysis of tris-(8-hydroxyquinoline) aluminum and indium-tin-oxide using atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS)

Applied Surface Science

Volumn 183, Issue 3-4, 2001, Pages 165-172

  Zheng, Daishun ^a   Li, Hairong ^a   Wang, Yanyong ^a   Zhang, Fujia ^a  

^a LANZHOU UNIVERSITY   (China)

Author keywords

Atomic force microscopy; Tris (8 hydroxyquinoline); X ray photoelectron spectroscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; BINDING ENERGY; LIGHT EMITTING DIODES; SPUTTERING; SURFACE REACTIONS; X RAY PHOTOELECTRON SPECTROSCOPY;

COORDINATION BONDS;

INDIUM COMPOUNDS;

EID: 0035965606     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00545-1     Document Type: Article

References (23)