Surface-enhanced Raman spectroscopy using self-assembled silver nanoparticles on silicon nanotips

Chemistry of Materials

Volumn 17, Issue 3, 2005, Pages 553-559

  Chattopadhyay, Surojit ^a   Lo, Hung Chun ^a   Hsu, Chih Hsun ^b   Chen, Li Chyong ^b   Chen, Kuei Hsien ^a,b  

^a INSTITUTE OF ATOMIC AND MOLECULAR SCIENCES   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; DRY ETCHING; ELECTRON CYCLOTRON RESONANCE; ETHYLENE; RAMAN SPECTROSCOPY; SELF ASSEMBLY; SILICON; SILVER; SPUTTERING; SUBSTRATES;

SILICON NANOTIPS; SILVER NANOPARTICLES; SURFACE-ENHANCED RAMAN SPECTROSCOPY; WET CHEMISTRY;

NANOSTRUCTURED MATERIALS;

RHODAMINE; SILICON; SILVER;

ANALYTIC METHOD; ARTICLE; CHEMICAL ANALYSIS; CYCLOTRON; DEVICE; ELECTROCHEMISTRY; NANOPARTICLE; POROSITY; QUANTITATIVE ANALYSIS; RAMAN SPECTROMETRY; REPRODUCIBILITY; SURFACE ENHANCED LASER DESORPTION IONIZATION TIME OF FLIGHT MASS SPECTROMETRY; TECHNOLOGY;

EID: 13444251401     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm049269y     Document Type: Article

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