Structural and magnetic properties of η-phase manganese nitride films grown by molecular-beam epitaxy

Applied Physics Letters

Volumn 78, Issue 24, 2001, Pages 3860-3862

  Yang, Haiqiang ^a   Al Brithen, Hamad ^a   Smith, Arthur R ^a   Borchers, J A ^b   Cappelletti, R L ^b   Vaudin, M D ^b  

^a OHIO UNIVERSITY   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035844366     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1378800     Document Type: Article

References (17)

1. J. P. Dismukes, W. M. Yim, and V. S. Ban, J. Cryst. Growth 13, 365 (1972).
2. T. D. Moustakas, R. J. Molnar, and J. P. Dismukes, Electrochem. Soc. Proceedings 11, 197 (1996).
3. D. Gall, I. Petrov, P. Desjardins, and J. E. Greene, J. Appl. Phys. 86, 5524 (1999).
4. D. Gall, I. Petrov, N. Hellgren, L. Hultman, J. E. Sundgren, and J. E. Greene, J. Appl. Phys. 84, 6034 (1998).
5. H. A. H. Al-Brithen and A. R. Smith, Appl. Phys. Lett. 77, 2485 (2000).
6. A. R. Smith, H. A. H. Al-Brithen, and D. Gall (unpublished).
7. S. Yang, D. B. Lewis, I. Wadsworth, J. Cawley, J. S. Brooks, and W. D. Munz, Surf. Coat. Technol. 131, 228 (2000); K. Inumaru, T. Ohara, and S. Yamanaka, Appl. Surf. Sci. 158, 375 (2000).
8. S. Yang, D. B. Lewis, I. Wadsworth, J. Cawley, J. S. Brooks, and W. D. Munz, Surf. Coat. Technol. 131, 228 (2000); K. Inumaru, T. Ohara, and S. Yamanaka, Appl. Surf. Sci. 158, 375 (2000).
9. G. Kreiner and H. Jacobs, J. Alloys Compd. 183, 345 (1992).
10. K. Suzuki, T. Kaneko, H. Yoshida, Y. Obi, H. Fujimori, and H. Morita, J. Alloys Compd. 306, 66 (2000).
11. K. Suzuki, H. Morita, T. Kandeko, H. Yoshida, and H. Fujimori, J. Alloys Compd. 201, 11 (1993).
12. K. Suzuki, T. Kaneko, H. Yoshida, H. Morita, and H. Fujimori, J. Alloys Compd. 224, 232 (1995).
13. T. Dietl, H. Ohno, F. Matsukura, J. Ciberg, and D. Ferrand, Science 287, 1019 (2000).
14. H. Ohno, Science 281, 951 (1998).
15. Y. Ohno, D. K. Young, B. Beschoten, F. Matsukura, H. Ohno, and D. D. Awschalom, Nature (London) 402, 790 (1999).
16. Inorganic Index to Powder Diffraction File (Joint Committee on Powder Diffraction Standards, International Center for Powder Diffraction Data, Swarthmore, PA, 1997): MgO-Card No. 04-0820.
17. The STM xy calibration is approximately known from previous studies of other systems, including ScN(001) and GaN(0001) but not to better than a few percent here.