On test and diagnostics of flash memories

Proceedings of the Asian Test Symposium

Volumn , Issue , 2004, Pages 260-265

  Huang, Chih Tsun ^a   Yeh, Jen Chieh ^a   Shih, Yuan Yuan ^a   Huang, Rei Fu ^a   Wu, Cheng Wen ^a  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER ARCHITECTURE; COSTS; DESIGN FOR TESTABILITY; FAILURE ANALYSIS; FIELD PROGRAMMABLE GATE ARRAYS; MATHEMATICAL MODELS; MICROPROCESSOR CHIPS; RANDOM ACCESS STORAGE; ULTRAVIOLET RADIATION;

ARRAY ARCHITECTURES; BUILT-IN SELF-TEST (BIST); FLASH MEMORY DESIGN; SYSTEM-ON-CHIP (SOC) PRODUCT;

DATA STORAGE EQUIPMENT;

EID: 13244277458     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)

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