Fault Pattern Oriented Defect Diagnosis for Memories

IEEE International Test Conference (TC)

Volumn , Issue , 2003, Pages 29-38

  Wang, Chih Wea ^a   Cheng, Kuo Liang ^a   Lee, Jih Nung ^a   Chou, Yung Fa ^a   Huang, Chih Tsun ^a   Wu, Cheng Wen ^a   Huang, Frank ^b   Yang, Hong Tzer ^b  

^a NATIONAL TSING HUA UNIVERSITY   (Taiwan)

^b Spirox Corporation   (Taiwan)

Author keywords

Bitmap; Failure analysis (FA); Fault pattern; Memory diagnostics; Memory testing; Semiconductor memory

Indexed keywords

COMPUTER SIMULATION; COMPUTER TESTING; MICROPROCESSOR CHIPS;

MEMORY TESTING;

DATA STORAGE EQUIPMENT;

EID: 0142153748     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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