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Volumn 37, Issue 2, 2005, Pages 230-234
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Structural analysis of Co thin films grown on Ge(111) at room temperature by x-ray photoelectron diffraction
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Author keywords
Co Ge(111) film; Cobalt germanides; Structure; X ray photoelectron diffraction
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Indexed keywords
CRYSTAL LATTICES;
DEPOSITION;
FILM GROWTH;
LOW ENERGY ELECTRON DIFFRACTION;
MOLECULAR BEAM EPITAXY;
PHASE TRANSITIONS;
THERMAL EFFECTS;
CO/GE(111) FILMS;
COBALT GERMANIDES;
INTERFACIAL LAYERS;
X-RAY PHOTOELECTRON DIFFRACTION (XPED);
ULTRATHIN FILMS;
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EID: 13244262839
PISSN: 01422421
EISSN: None
Source Type: Journal
DOI: 10.1002/sia.1971 Document Type: Conference Paper |
Times cited : (8)
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References (19)
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