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Volumn 65, Issue 15, 2002, Pages 1554251-1554256

Strain determination in ultrathin bcc Fe layers on Si(001) by x-ray diffraction

Author keywords

[No Author keywords available]

Indexed keywords

IRON; SILICON;

EID: 0037089268     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.65.155425     Document Type: Article
Times cited : (6)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.