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Volumn 65, Issue 15, 2002, Pages 1554251-1554256
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Strain determination in ultrathin bcc Fe layers on Si(001) by x-ray diffraction
a a a a a a a b c c |
Author keywords
[No Author keywords available]
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Indexed keywords
IRON;
SILICON;
ANISOTROPY;
ARTICLE;
CHEMICAL ANALYSIS;
ELASTICITY;
FILM;
MAGNETISM;
SYNTHESIS;
X RAY DIFFRACTION;
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EID: 0037089268
PISSN: 01631829
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevB.65.155425 Document Type: Article |
Times cited : (6)
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References (19)
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