Texture analysis of CoGe2 alloy films grown heteroepitaxially on GaAs(100) using partially ionized beam deposition

Journal of Applied Physics

Volumn 81, Issue 11, 1997, Pages 7261-7267

  Mello, K E ^a,c   Murarka, S P ^a,c   Lu, T M ^a,c   Lee, S L ^b  

^a RENSSELAER POLYTECHNIC INSTITUTE   (United States)

^b US Army ARDEC   (United States)

^c Dept of Mat Sci and Engineering ^*

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000792069     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365323     Document Type: Article

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