Characterization of SiC using synchrotron white beam X-ray topography

Materials Science Forum

Volumn 338, Issue , 2000, Pages

  Dudley, Michael ^a   Huang, Xianrong ^a  

^a Stony Brook University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DEFORMATION; DISLOCATIONS (CRYSTALS); NUCLEATION; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; VECTORS; X RAY ANALYSIS;

BURGERS VECTOR; MICROPIPE DEFECTS; SYNCHROTRON WHITE BEAM X RAY TOPOGRAPHY (SWBXT);

SILICON CARBIDE;

EID: 12944288316     PISSN: 02555476     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (15)

1. P. Neudeck, this conference, p. 1161
2. P.G. Neudeck, W. Huang, and M. Dudley: Mat. Res. Soc. Symp. Proc. 483 (1990), p. 285.
3. P. Neudeck, W. Huang, and M. Dudley: IEEE Trans. Electron. Devices 46 (1999), p. 478.
4. F.C. Frank, Acta Cryst. 4 (1951), p. 497.
5. W. Si, M. Dudley, R. Glass, V. Tsvetkov, and C. H. Carter, Jr.: J. Electronic Materials 26 (1997), p. 128.
6. M. Dudley, W. Si, S. Wang, C.H. Carter, Jr., R. Glass, and V.F. Tsvetkov: Il Nuovo Cimento 19D (1997), p. 153.
7. W. Si and M. Dudley, R. Glass, V. Tsvetkov, and C.H. Carter, Jr.: Materials Science Forum 264-268 (1998), pp. 429.
8. M. Dudley, S. Wang, W. Huang, C.H. Carter, Jr., and V. Tsvetkov: J. Phys. D 28 (1995), p. A63.
9. X.R. Huang, M. Dudley, W.M. Vetter, W. Huang and C.H. Carter, Jr.: Mat. Res. Soc. Symp. Proc. 524 (1998), p. 71.
10. X.R. Huang, M. Dudley, W. M. Vetter, W. Huang, S. Wang, and C. H. Carter, Jr.: Appl. Phys. Lett. 74 (1999), p. 353.
11. X. R. Huang, M. Dudley, W. M. Vetter, W. Huang, and W. Si, and C. H. Carter, Jr.: J. Appl. Cryst. 32 (1999), p. 516.
12. M. Dudley, X.R. Huang, and W. Huang: J. Phys. D: Appl. Phys. 32 (1999), p. A139.
13. M. Dudley: Appl. Phys. Lett. 75 (1999), p. 784.
14. A.A. Chernov, Contemp. Phys. 30 (1989), p. 251.
15. G. Neuroth, Ph.D. Thesis, University of Bonn, Germany (1996).